materials and optics background and be familiar with Metrology Equipment and Recipe development on one of the following techniques for thin film/OCD characterization- Ellipsometry, Scatterometry, Interferometry, Spectroscopy, Profilometry Thin Films, CD-SEM, AFM, XRD, FTIR etc
Job Details
ID | #51869330 |
Estado | New Mexico |
Ciudad | Edgewood |
Full-time | |
Salario | USD TBD TBD |
Fuente | INTEL |
Showed | 2024-06-09 |
Fecha | 2024-06-05 |
Fecha tope | 2024-08-04 |
Categoría | Tv/cine/vídeo/radio |
Crear un currículum vítae | |
Aplica ya |
Thin Films Metrology Process Engineer
New Mexico, Edgewood, 87015 Edgewood USA