materials and optics background and be familiar with Metrology Equipment and Recipe development on one of the following techniques for thin film/OCD characterization- Ellipsometry, Scatterometry, Interferometry, Spectroscopy, Profilometry Thin Films, CD-SEM, AFM, XRD, FTIR etc
Job Details
| ID | #51869330 |
| Estado | New Mexico |
| Ciudad | Edgewood |
| Fuente | INTEL |
| Showed | 2024-06-09 |
| Fecha | 2024-06-05 |
| Fecha tope | 2024-08-04 |
| Categoría | Tv/cine/vídeo/radio |
| Crear un currículum vítae |
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